纳米尺度
红外线的
原子力显微镜
红外光谱学
纳米技术
化学
光谱学
化学成像
分析化学(期刊)
材料科学
光学
遥感
物理
有机化学
高光谱成像
地质学
量子力学
作者
Alexandre Dazzi,Craig Prater
出处
期刊:Chemical Reviews
[American Chemical Society]
日期:2016-12-13
卷期号:117 (7): 5146-5173
被引量:810
标识
DOI:10.1021/acs.chemrev.6b00448
摘要
Atomic force microscopy-based infrared spectroscopy (AFM-IR) is a rapidly emerging technique that provides chemical analysis and compositional mapping with spatial resolution far below conventional optical diffraction limits. AFM-IR works by using the tip of an AFM probe to locally detect thermal expansion in a sample resulting from absorption of infrared radiation. AFM-IR thus can provide the spatial resolution of AFM in combination with the chemical analysis and compositional imaging capabilities of infrared spectroscopy. This article briefly reviews the development and underlying technology of AFM-IR, including recent advances, and then surveys a wide range of applications and investigations using AFM-IR. AFM-IR applications that will be discussed include those in polymers, life sciences, photonics, solar cells, semiconductors, pharmaceuticals, and cultural heritage. In the Supporting Information, the authors provide a theoretical section that reviews the physics underlying the AFM-IR measurement and detection mechanisms.
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