绝缘体上的硅
光学
栅栏
材料科学
包层(金属加工)
衍射光栅
波长
衍射效率
光电子学
极化(电化学)
硅
物理
物理化学
化学
冶金
作者
Laurent Vivien,Pascal,S. Lardenois,Marris-Morini,Éric Cassan,Grillot,Laval,Fedeli,L. El Melhaoui
标识
DOI:10.1109/jlt.2006.878060
摘要
An experimental characterization of the grating couplers for sub-micrometer silicon-on-insulator (SOI) waveguides is presented. The grating couplers have been designed, realized, and characterized for the +1 diffraction order at an operating wavelength of 1.31 /spl mu/m for TE polarization. At the resonant angle, a coupling efficiency higher than 55% has been measured. The angular coupling range and the wavelength tolerance have been evaluated to 3/spl deg/ and 20 nm, respectively. The grating coupler is followed by a taper, and about 50% of the input power at 1.31 /spl mu/m is coupled into sub-micrometer rib and strip SOI waveguides. The ration between light power decoupled toward the cladding and light power decoupled toward the substrate is about three.
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