原子层沉积
微电子
薄膜
纳米技术
材料科学
原子层外延
制作
图层(电子)
沉积(地质)
光电子学
纳米结构
医学
古生物学
替代医学
病理
生物
沉积物
作者
Tommi Tynell,Maarit Karppinen
标识
DOI:10.1088/0268-1242/29/4/043001
摘要
Due to the unique set of properties possessed by ZnO, thin films of ZnO have received more and more interest in the last 20 years as a potential material for applications such as thin-film transistors, light-emitting diodes and gas sensors. At the same time, the increasingly stringent requirements of the microelectronics industry, among other factors, have led to a dramatic increase in the use of atomic layer deposition (ALD) technique in various thin-film applications. During this time, the research on ALD-grown ZnO thin films has developed from relatively simple deposition studies to the fabrication of increasingly intricate nanostructures and an understanding of the factors affecting the fundamental properties of the films. In this review, we give an overview of the current state of ZnO ALD research including the applications that are being considered for ZnO thin films.
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