电缆密封套
通用串口总线
静电放电
计算机科学
材料科学
嵌入式系统
电气工程
光电子学
工程类
操作系统
软件
电压
作者
Li Wern Chew,Ming Dak Chai
标识
DOI:10.1109/eptc56328.2022.10013176
摘要
This paper proposed a novel connector structure, namely the enhanced reversible USB (eUSB-R) receptacle connector, that could prevent the Electrostatic Discharge/Electrical Overstress protection (ESD/EOS) event cause by the plugging angle of conventional USB-C connector. With a protrude and/or concave structure that eUSB-R connector has, it not only retains the "single/universal connector" as well as "reversibility" properties of USB-C, it also does not introduce any additional manufacturing cost, nor any implies any complication to the platform design for USB4/USB3 buses. Furthermore, with eUSB-R, the existing ESD/EOS short circuit protection on USB data lanes could be removed, leads to significant platform cost saving and layout area optimization. It is also shown that signal integrity performance improvement can be achieved with lower insertion loss and refection noise as the outcome of the ESD/EOS components removal.
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