电致发光
钙钛矿(结构)
材料科学
光电子学
光伏系统
卤化物
亚稳态
可靠性(半导体)
发光
压力(语言学)
降级(电信)
纳米技术
计算机科学
物理
电气工程
化学
电信
工程类
哲学
量子力学
功率(物理)
语言学
无机化学
图层(电子)
结晶学
作者
Jackson W. Schall,Hsinhan Tsai,Harvey Guthrey,Chun-Sheng Jiang,Steve Johnston,Dana B. Kern,Andrew B. Norman,Mowafak Al-Jassim
标识
DOI:10.1109/pvsc48317.2022.9938656
摘要
We present an approach to evaluate perovskite solar cell reliability and metastability during 100-hour stress/rest cycling under electrical bias with in-situ electroluminescence (EL) imaging. We show an example of time-evolving EL and associated voltage transients under constant current bias for triple-cation mixed-halide devices with defects of lead-iodide-rich wrinkles. We observe the greatest degradation in the regions of the wrinkles. Our results demonstrate how time-evolving luminescence imaging can be applied to better understand impacts of spatial imperfections on perovskite photovoltaic device stability.
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