氢
声表面波
薄膜
材料科学
国家(计算机科学)
氧化态
钯
化学工程
光电子学
声学
催化作用
纳米技术
化学
计算机科学
冶金
物理
金属
工程类
有机化学
算法
作者
Jing Jin,Baile Cui,Linyu Zhou,Lina Cheng,Xufeng Xue,Anyi Hu,Yong Liang,Wen Wang
出处
期刊:ACS Sensors
[American Chemical Society]
日期:2024-05-09
卷期号:9 (5): 2395-2401
标识
DOI:10.1021/acssensors.4c00007
摘要
PdNi alloy thin films demonstrate exceptional hydrogen sensing performance and exhibit significant potential for application in surface acoustic wave (SAW) hydrogen sensors. However, the long-term stability of SAW H2 sensors utilizing PdNi films as catalysts experiences a substantial decrease during operation. In this paper, X-ray photoelectron spectroscopy (XPS) is employed to investigate the failure mechanisms of PdNi thin films under operational conditions. The XPS analysis reveals that the formation of PdO species on PdNi thin films plays a crucial role in the failure of hydrogen sensing. Additionally, density functional theory (DFT) calculations indicate that hydrogen atoms encounter a diffusion energy barrier during the penetration process from the PdNiOx surface to the subsurface region. The identification of PdNi film failure mechanisms through XPS and DFT offers valuable insights into the development of gas sensors with enhanced long-term stability. Guided by these mechanisms, we propose a method to restore the hydrogen sensing response time and magnitude to a certain extent by reducing the partially oxidized surface of the PdNi alloy under a hydrogen atmosphere at 70 °C, thereby restoring Pd to its metallic state with zero valence.
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