X-ray sensitivity of Cd0.9Zn0.1Te detectors

The X-ray sensitivity of Cd0.9Zn0.1Te detectors as a function of the effective X-ray energy and bias voltage is studied. It is shown that the sensitivity grows with effective X-ray energy and much more significantly with bias voltage. The sensitivity depends on the angle the X-ray beam makes with an electric field in the detector. In the energy range 28–72 keV, the sensitivity is the highest when the X-ray beam is normal to the electric field in the detector.