A − °C–125 °C 0.4-μA Low-Noise Bandgap Voltage Reference With 0.8-mA Load Driving Capability Using Shared Feedback Resistors

This brief presents a fully integrated low-power, low noise bandgap reference (BGR) with load driving capability. With the BGR core resistors functioning as the feedback network of the current sourcing power transistor, the proposed BGR saves chip area, reduces noise while supporting current load driving. The circuit is implemented in two different processes for performance comparison, namely the $0.18\mathbf {\mathrm {\mu }}\text{m}$ RF CMOS and the BCD mixed-signal CMOS processes. Measurement results from chip samples of the two processes show similar performances, with an average temperature coefficient (TC) of 27.1ppm/°C over $\mathbf {-} 40\mathbf {\mathrm {\sim }} 125\mathbf {^{\circ} }\text{C}$ at a 1.8-V supply. The corresponding measured coefficient of variation ( $\mathbf {\mathrm {\sigma }}/\mathbf {\mathrm {\mu }}$ ) is around 0.3%, and the load driving capability can be up to $800\mathbf {\mathrm {\mu }}\text{A}$ . By reusing the feedback resistors, the chip prototype achieved a low noise density of $1.92~\mathbf {\mathrm {\mu }}\text{V}/\surd $ Hz, 285nV/ $\surd $ Hz and 4nV/ $\surd $ Hz at 10 Hz, 10 kHz and 100 kHz, respectively, while consuming a quiescent current of 396nA. The measured power supply rejection (PSR) is −39dB at 5Hz and −45dB at 1MHz. The influence of load current on PSR has also been analyzed and verified.