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The Materials Challenge in Diffraction-Unlimited Direct-Laser-Writing Optical Lithography

材料科学 光刻胶 平版印刷术 光电子学 吸收(声学) 激光器 光学 激发 衍射 双光子激发显微术 纳米技术 荧光 图层(电子) 复合材料 工程类 物理 电气工程
作者
Joachim Fischer,Georg von Freymann,Martin Wegener
出处
期刊:Advanced Materials [Wiley]
卷期号:22 (32): 3578-3582 被引量:239
标识
DOI:10.1002/adma.201000892
摘要

Advanced MaterialsVolume 22, Issue 32 p. 3578-3582 Communication The Materials Challenge in Diffraction-Unlimited Direct-Laser-Writing Optical Lithography Joachim Fischer, Corresponding Author Joachim Fischer [email protected] Institut für Angewandte Physik and DFG-Center for Functional, Nanostructures (CFN), Karlsruhe Institute of Technology (KIT), Wolfgang-Gaede-Straße 1, D-76131 Karlsruhe (Germany)Institut für Angewandte Physik and DFG-Center for Functional, Nanostructures (CFN), Karlsruhe Institute of Technology (KIT), Wolfgang-Gaede-Straße 1, D-76131 Karlsruhe (Germany).Search for more papers by this authorGeorg von Freymann, Georg von Freymann Institut für Angewandte Physik and DFG-Center for Functional, Nanostructures (CFN), Karlsruhe Institute of Technology (KIT), Wolfgang-Gaede-Straße 1, D-76131 Karlsruhe (Germany) Institut für Nanotechnologie, Karlsruhe Institute of Technology (KIT), Hermann-von-Helmholtz-Platz 1, D-76344 Eggenstein-Leopoldshafen (Germany)Search for more papers by this authorMartin Wegener, Martin Wegener Institut für Angewandte Physik and DFG-Center for Functional, Nanostructures (CFN), Karlsruhe Institute of Technology (KIT), Wolfgang-Gaede-Straße 1, D-76131 Karlsruhe (Germany) Institut für Nanotechnologie, Karlsruhe Institute of Technology (KIT), Hermann-von-Helmholtz-Platz 1, D-76344 Eggenstein-Leopoldshafen (Germany)Search for more papers by this author Joachim Fischer, Corresponding Author Joachim Fischer [email protected] Institut für Angewandte Physik and DFG-Center for Functional, Nanostructures (CFN), Karlsruhe Institute of Technology (KIT), Wolfgang-Gaede-Straße 1, D-76131 Karlsruhe (Germany)Institut für Angewandte Physik and DFG-Center for Functional, Nanostructures (CFN), Karlsruhe Institute of Technology (KIT), Wolfgang-Gaede-Straße 1, D-76131 Karlsruhe (Germany).Search for more papers by this authorGeorg von Freymann, Georg von Freymann Institut für Angewandte Physik and DFG-Center for Functional, Nanostructures (CFN), Karlsruhe Institute of Technology (KIT), Wolfgang-Gaede-Straße 1, D-76131 Karlsruhe (Germany) Institut für Nanotechnologie, Karlsruhe Institute of Technology (KIT), Hermann-von-Helmholtz-Platz 1, D-76344 Eggenstein-Leopoldshafen (Germany)Search for more papers by this authorMartin Wegener, Martin Wegener Institut für Angewandte Physik and DFG-Center for Functional, Nanostructures (CFN), Karlsruhe Institute of Technology (KIT), Wolfgang-Gaede-Straße 1, D-76131 Karlsruhe (Germany) Institut für Nanotechnologie, Karlsruhe Institute of Technology (KIT), Hermann-von-Helmholtz-Platz 1, D-76344 Eggenstein-Leopoldshafen (Germany)Search for more papers by this author First published: 30 June 2010 https://doi.org/10.1002/adma.201000892Citations: 203Read the full textAboutPDF ToolsRequest permissionExport citationAdd to favoritesTrack citation ShareShare Give accessShare full text accessShare full-text accessPlease review our Terms and Conditions of Use and check box below to share full-text version of article.I have read and accept the Wiley Online Library Terms and Conditions of UseShareable LinkUse the link below to share a full-text version of this article with your friends and colleagues. Learn more.Copy URL Graphical Abstract Using a novel photoresist (composed of pentaerythritol triacrylate and isopropyl thioxanthone) that favors stimulated emission depletion by a π-π* transition and using a two-color two-photon excitation scheme, 65-nm wide lines are achieved. This value is limited by parasitic two-photon absorption of the continuous-wave depletion beam. It is estimated that, without this process, line widths of 30 nm are in reach. References 1 S. W. Hell, J. Wichmann, Opt. Lett. 1994, 19, 780. 2 T. A. Klar, S. Jakobs, M. Dyba, A. Egner, S. W. Hell, Proc. Natl. Acad. Sci. 2000, 97, 8206. 3 S. W. Hell, Phys. Lett. A 2004, 326, 140. 4 S. W. Hell, Nat. Methods 2009, 6, 24. 5 K. I. Willig, S. O. Rizzoli, V. Westphal, R. Jahn, S. W. Hell, Nature 2006, 440, 935. 6 S. W. Hell, R. Schmidt, A. Egner, Nat. Photon. 2009, 3, 381. 7 E. Rittweger, K. Y. Han, S. E. Irvine, C. Eggeling, S. W. Hell, Nat. Photon. 2009, 3, 144. 8 S. Kawata, H.-B. Sun, T. Tanaka, K. Takada, Nature 2001, 412, 697. 9 M. Deubel, G. von Freymann, M. Wegener, S. Pereira, K. Busch, C. M. Soukoulis, Nat. Mater. 2004, 3, 444. 10 G. von Freymann, A. Ledermann, M. Thiel, I. Staude, S. Essig, K. Busch, M. Wegener, Adv. Funct. Mater. 2010, 20, 1038. 11 T. F. Scott, B. A. Kowalski, A. C. Sullivan, C. N. Bowman, R. R. McLeod, Science 2009, 324, 913. 12 L. Li, R. R. Gattass, E. Gershgoren, H. Hwang, J. T. Fourkas, Science 2009, 324, 910. 13 J. V. Morris, M. A. Mahaney, J. R. Huber, J. Phys. Chem. 1976, 80, 969. 14 M. Mardelli, J. Olmsted, J. Photochem. 1977, 7, 277. 15 C. S. Colley, D. C. Grills, N. A. Besley, S. Jockusch, P. Matousek, A. W. Parker, M. Towrie, N. J. Turro, P. M. W. Gill, M. W. George, J. Am. Chem. Soc. 2002, 124, 14952. 16 G. Amirzadeh, W. Schnabel, Makromol. Chem. 1981, 182, 2821. 17 T. I. Lai, E. C. LIM, Chem. Phys. Lett. 1980, 73, 244. 18 K. I. Willig, B. Harke, R. Medda, S. W. Hell, Nature Meth. 2007, 4, 915. 19 P. Török, P. Munro, Opt. Express 2004, 12, 3605. 20 A. S. van de Nes, L. Billy, S. F. Pereira, J. J. M. Braat, Opt. Express 2004, 12, 1281. Citing Literature Volume22, Issue32August 24, 2010Pages 3578-3582 ReferencesRelatedInformation
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