化学机械平面化
微电子机械系统
微电子
薄脆饼
晶体管
微处理器
电气工程
材料科学
晶片键合
电子工程
工程类
计算机科学
纳米技术
电压
图层(电子)
出处
期刊:Elsevier eBooks
[Elsevier]
日期:2021-09-17
卷期号:: 533-557
被引量:2
标识
DOI:10.1016/b978-0-12-821791-7.00001-0
摘要
In addition to the on-going increase in memory capacity and microprocessor performance of devices ("More Moore"), other functionalities like analog/RF devices, passive components, high voltage and power transistors, sensors and actuators (MEMS, MOEMS), or biochips are more and more incorporated to microelectronic systems ("More than Moore"). Chemical-mechanical planarization (CMP), a key manufacturing step enabling the continuation of Moore's Law, is increasingly employed also for the fabrication of "More than Moore" devices. In this chapter, the application of CMP for power transistors, MEMS and micro-opto devices and wafer bonding will be discussed in detail and examples of these devices will be presented.
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