半导体
太赫兹辐射
超材料
光电子学
材料科学
电介质
基质(水族馆)
红外线的
平面的
薄膜
光学
纳米技术
物理
计算机科学
地质学
计算机图形学(图像)
海洋学
作者
Zohreh Vafapour,Hossain Ghahraloud
出处
期刊:Journal of The Optical Society of America B-optical Physics
[The Optical Society]
日期:2018-04-24
卷期号:35 (5): 1192-1192
被引量:54
标识
DOI:10.1364/josab.35.001192
摘要
By incorporating a dielectric material into a semiconductor thin film, we have demonstrated an optically reconfigurable classical electromagnetically induced reflectance (Cl-EIR) effect in planar metamaterials (MMs) functioning at the far-infrared (far-IR) frequency regime. The proposed far-IR sensor is a microstructure composed of a semiconductor thin film and three dielectric antennas. Numerical analyses based on the far- and near-field interaction are investigated in detail. The coupling between the subradiant and supperradiant modes verify the existence of the Cl-EIR effect. The Cl-EIR frequency could be tuned by changing the surrounding medium, the temperature of the semiconductor layer, the semiconductor material, and the substrate material. Therefore, the proposed complementary MM microstructure, based on a semiconductor featuring tunable reflectance windows, may open up new avenues for designing tunable temperature sensors, optical and biomedical sensors, switches, and slow light devices.
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