电压
充电泵
电荷(物理)
CMOS芯片
材料科学
低压
电气工程
基质(水族馆)
相(物质)
阈值电压
光电子学
电流(流体)
物理
工程类
晶体管
电容器
海洋学
量子力学
地质学
作者
Hongchin Lin,Jain-Hao Lu,Yen-Tai Lin
标识
DOI:10.1109/apasic.2002.1031530
摘要
A new four-phase charge pumping circuit for low supply voltages using 0.6 /spl mu/m triple-well CMOS technology to generate high negative boosted voltages is presented. With the new substrate connected technique, the influence of threshold voltage (-0.94 V) is minimized and the body effect is almost eliminated. A five-stage charge pump can efficiently pump lower than -7 V at supply voltage of 1.8 V with 100 /spl mu/A loading current.
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