太赫兹辐射
材料科学
等离子体子
光学
吸收(声学)
光电子学
宽带
吸光度
平面的
太赫兹间隙
远红外激光器
太赫兹超材料
物理
激光器
计算机图形学(图像)
计算机科学
复合材料
作者
Yongzhi Cheng,Withawat Withayachumnankul,Aditi Upadhyay,Daniel Headland,Yan Nie,Rong Zhou Gong,Madhu Bhaskaran,Sharath Sriram,Derek Abbott
标识
DOI:10.1002/adom.201400368
摘要
Perfect absorbers that exhibit broadband absorption of terahertz radiation are promising for applications in imaging and detection due to enhanced contrast and sensitivity in this relatively untapped frequency regime. Here, terahertz plasmonics is used to demonstrate near‐unity absorption across a broad spectral range. The absorber comprises a planar array of cross‐shaped structures defined by surface etching of doped silicon. Absorbance of over 90% is observed numerically with a relative bandwidth of 90% from 0.67 to 1.78 THz, in reasonable agreement with experimental observation. This ultrabroadband absorption is attributed to two resonance modes supported by plasmonic cavities that are defined by the etched cross structure. This terahertz absorber is single‐layered, polarization‐insensitive, and exhibits consistent performance across a wide range of incidence angles. The plasmonic‐based approach for enhancing absorption is a potential precursor to the realization of efficient bolometric imaging and communications at terahertz frequencies.
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