X射线光电子能谱
氧化物
表征(材料科学)
范围(计算机科学)
材料科学
工作(物理)
相(物质)
分析化学(期刊)
化学
化学工程
冶金
纳米技术
热力学
计算机科学
物理
有机化学
工程类
程序设计语言
标识
DOI:10.1002/sia.740120210
摘要
Abstract The principal scope of this work is to explore the capacity of XPS spectroscopy in the characterization of oxides through consideration of O 1s spectra. Several examples of oxides, analysed both separately and in the form of mechanical mixtures, are reviewed. The quantitative aspects involved in the XPS analysis of oxide mixtures were studied by use of an approach based on intensity ratio measurements of the single O 1s components. Results obtained in the mixtures are utilized for establishing the presence, or otherwise, of a single oxidic phase at real interfaces of iron‐alumina systems, metallurgical coatings, and glasses.
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