扩展X射线吸收精细结构
氧烷
X射线吸收光谱法
材料科学
吸收(声学)
化学
X射线吸收精细结构
表面扩展X射线吸收精细结构
吸收光谱法
作者
J. J. Rehr,A. L. Ankudinov,S. I. Zabinsky
标识
DOI:10.1016/s0920-5861(97)00109-0
摘要
Recent advances in the theory of X-ray absorption fine structure (XAFS) are reviewed. Modern ab initio multiple-scattering (MS) calculations now provide an accurate, unified treatment of XAFS, encompassing both EXAFS (extended-XAFS), NEXAFS (near-edge XAFS) and XANES (X-ray absorption near-edge structure). Combined with multi-path analysis techniques, such calculations now permit accurate structural determinations well beyond the first near-neighbor. These calculations also describe near-edge features such as σ* shape resonances and white lines. Implications for catalyst research are briefly discussed.
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