可靠性(半导体)
计算机科学
可靠性工程
统计
数学
工程类
量子力学
物理
功率(物理)
出处
期刊:Technometrics
[Informa]
日期:1998-08-01
卷期号:40 (3): 254-256
被引量:596
标识
DOI:10.1080/00401706.1998.10485526
摘要
Partial table of contents: Reliability Concepts and Reliability Data. Nonparametric Estimation. Other Parametric Distributions. Probability Plotting. Bootstrap Confidence Intervals. Planning Life Tests. Degradation Data, Models, and Data Analysis. Introduction to the Use of Bayesian Methods for Reliability Data. Failure--Time Regression Analysis. Accelerated Test Models. Accelerated Life Tests. Case Studies and Further Applications. Epilogue. Appendices. References. Indexes.
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