记忆电阻器
CMOS芯片
电子工程
光电子学
材料科学
计算机科学
工程类
作者
Z. G. Wang,Guobin Zhang,Pengtao Li,Shengpeng Xing,Li Wang,Xuemeng Fan,Jiabao Sun,Dawei Gao,Qing Wan,Yishu Zhang
出处
期刊:Physical review applied
[American Physical Society]
日期:2024-12-02
卷期号:22 (6)
标识
DOI:10.1103/physrevapplied.22.064003
摘要
The integration of memristor-based devices in large-scale passive arrays necessitates the development of self-rectifying memristors (SRMs). However, existing SRMs face significant challenges in achieving high on:off and self-rectification ratios while maintaining complementary metal-oxide semiconductor (CMOS) compatibility. Here, we present a SRM with a $\mathrm{Pt}/{\mathrm{WO}}_{3}/{\mathrm{WO}}_{3\ensuremath{-}x}/\mathrm{Ti}\mathrm{N}$ structure, which exhibits an impressive rectification ratio (approximately ${10}^{5}$), satisfactory on:off ratio (around ${10}^{3}$), low operation voltage (2 V), and high stability (>${10}^{6}$ s, ${10}^{4}$ cycles). When incorporated into a 100 \ifmmode\times\else\texttimes\fi{} 100 array, this device achieves a remarkable resistance reading accuracy of 97.3%. Furthermore, by setting the read margin to 10%, the passive array integrated with this device can reach a storage capacity of up to 180.3 Gb. At the same time, we simulate an on-chip convolutional neural network based on a 32 \ifmmode\times\else\texttimes\fi{} 32 passive array, achieving a recognition accuracy of 99.1% for the handwritten digits ``0,'' ``1,'' and ``2.'' The use of CMOS-compatible materials and a simple single-oxide-layer structure can significantly reduce industrial costs. These advancements offer valuable insights for the development of practical and scalable SRMs, paving the way for their widespread integration in large-scale in-memory computing applications.
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