材料科学
光电子学
宽禁带半导体
肖特基势垒
二极管
氮化镓
击穿电压
肖特基二极管
发光二极管
电压
纳米技术
电气工程
图层(电子)
工程类
作者
Junye Wu,Zeliang Liao,Haofan Wang,Zou Ping,Renqiang Zhu,Wuque Cai,Wenrong Zhuang,Yudi Tu,Heng Chen,Xinbo Xiong,Hsien‐Chin Chiu,Xiaohua Li,Xinke Liu
摘要
In this work, vertical gallium nitride (GaN) Schottky barrier diodes (SBDs) with an ultra-low turn-on voltage VON (0.37 V) were demonstrated. Due to the process of O2 plasma treatment, GaON was formed on the surface of GaN and further modified the surface potential of the material surface, which made the VON decrease from 0.62 to 0.37 V. Spin-on-glass was deposited on top of devices to form the floating guard ring, which was used to improve the breakdown voltage to 681 V (at J = 1 A/cm2) by reducing the electric field distribution. The vertical GaN SBDs exhibit a specific on-resistance (RON) of 2.6 mΩ cm2. Deterioration of the device under different stress time changes slightly showed great stability of the devices.
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