光电探测器
光探测
响应度
异质结
光电子学
材料科学
微秒
外延
响应时间
比探测率
铋
基质(水族馆)
光电流
宽带
光电导性
纳米技术
光学
计算机科学
物理
图层(电子)
地质学
冶金
计算机图形学(图像)
海洋学
作者
Zhaoying Dang,Wenhui Wang,Jiayi Chen,Emily Walker,Seth R. Bank,Deji Akinwande,Zhenhua Ni,Li Tao
出处
期刊:2D materials
[IOP Publishing]
日期:2021-03-19
卷期号:8 (3): 035002-035002
被引量:24
标识
DOI:10.1088/2053-1583/abea65
摘要
Abstract Atomic sheets of bismuth (Bi) have been expected to yield exotic optoelectronic properties, holding great promise for photodetector devices. However, existing Bi thin film photodetectors have limited performance in terms of photoresponsivity or response time, hindering its practical application. Herein, we report an experimental research progress on optoelectronic properties of epitaxial 2D Bi grown on Si(111) substrate. Our 2D Bi/Si(111) heterolayer exhibits inspiring photodetection performance, including a Vis-NIR broadband response with a responsivity up to 80 A W −1 and response time ∼3 μ s, which is attributed to promoted generation and transportation of charge carriers in the heterojunction. 2D Bi/Si(111) here also demonstrates stable and reproducible photo switching behavior. This work paves an avenue to develop photodetectors based on heterointerface between group VA Xene and Si(111) with rapid switching behavior and adequate photoresponsivity.
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