材料科学
碳纳米管
接口(物质)
碳纳米管量子点
态密度
局域态密度
纳米管
凝聚态物理
纳米技术
工程物理
化学物理
物理
复合材料
毛细管数
毛细管作用
作者
Ha Jin Kim,Jhinhwan Lee,Sung-Jun Lee,Young Kuk,Ji‐Yong Park,Se‐Jong Kahng
标识
DOI:10.1103/physrevb.71.235402
摘要
The local electronic structure of semiconducting single-wall carbon nanotubes was studied with scanning tunneling microscopy. We performed scanning tunneling spectroscopy measurement at selected locations on the center axis of carbon nanotubes, acquiring a map of the electronic density of states. Spatial oscillation was observed in the electronic density of states with the period of atomic lattice. Defect induced interface states were found at the junctions of the two semiconducting nanotubes, which are well-understood in analogy with the interface states of bulk semiconductor heterostructures. The electronic leak of the van Hove singularity peaks was observed across the junction, due to inefficient charge screening in a one-dimensional structure.
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