Polarimetric imaging and encryption improve target recognition precision and information security, enhancing image sensors' perceptual acuity and interference resilience. However, the miniaturization of sensing systems faces challenges due to the complex integration of dispersive optical components such as polarizers. To address this, we propose a polarization-sensitive photodetector using a Te/ReSe2 van der Waals heterostructure. This design leverages type-II band alignment for efficient photocarrier segregation. The anisotropic crystal orientations of ReSe2 and Te layers integrate photon absorption with photocarrier extraction, boosting the functionality. The Te/ReSe2 device offers a broad spectral photoresponse (300-965 nm), a high polarization ratio of 8.9, and a fast response time of 55.4/55.7 μs at 635 nm. These properties enable high-resolution polarimetric imaging and precise image processing. This study provides a blueprint for developing miniaturized polarization-sensitive photodetectors and advancing lensless polarimetric optoelectronics.