欧姆接触
材料科学
微尺度化学
钝化
薄脆饼
接触电阻
光电子学
硅
扫描电子显微镜
激光器
纳米技术
接触面积
复合材料
光学
数学教育
数学
物理
图层(电子)
作者
Stephan Großer,Eve Krassowski,Sina Swatek,Hongming Zhao,Christian Hagendorf
出处
期刊:IEEE Journal of Photovoltaics
日期:2022-01-01
卷期号:12 (1): 26-30
被引量:13
标识
DOI:10.1109/jphotov.2021.3129362
摘要
A technique to improve contacts of solar cells laser enhanced contact optimization (LECO) has been studied in terms of micro scale contact formation at industrial PERC solar cells. High-resolution diagnostics by focused ion beam techniques and scanning electron and transmission electron microscopy indicate the LECO-induced formation of microscopic contacts at the buried interface between the screen-printed silver finger and the silicon wafer. A large quantity of these micro contacts where found exclusively for LECO processed cells. Target preparation and three-dimension cross-section investigation reveal an interdiffusion of the Ag and Si material as the underlying root cause for improved local contact resistivity. We propose a descriptive model for local ohmic contact formation maintaining surface passivation.
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