条纹
人工智能
计算机科学
工件(错误)
还原(数学)
模式识别(心理学)
计算机视觉
深度学习
卷积神经网络
迭代重建
压缩传感
数学
光学
物理
几何学
作者
Takuji Okamoto,Takashi Ohnishi,Hideaki Haneishi
出处
期刊:IEEE transactions on radiation and plasma medical sciences
[Institute of Electrical and Electronics Engineers]
日期:2022-11-01
卷期号:6 (8): 859-873
被引量:12
标识
DOI:10.1109/trpms.2022.3168970
摘要
Sparse-view computed tomography (CT), an imaging technique that reduces the number of projections, can reduce the total scan duration and radiation dose. However, sparse data sampling causes streak artifacts on images reconstructed with analytical algorithms. In this article, we propose an artifact reduction method for sparse-view CT using deep learning. We developed a lightweight fully convolutional network to estimate a fully sampled sinogram from a sparse-view sinogram by enlargement in the vertical direction. Furthermore, we introduced the band patch, a rectangular region cropped in the vertical direction, as an input image for the network based on the sinogram’s characteristics. Comparison experiments using a swine rib dataset of micro-CT scans and a chest dataset of clinical CT scans were conducted to compare the proposed method, improved U-net from a previous study, and the U-net with band patches. The experimental results showed that the proposed method achieved the best performance and the U-net with band patches had the second-best result in terms of accuracy and prediction time. In addition, the reconstructed images of the proposed method suppressed streak artifacts while preserving the object’s structural information. We confirmed that the proposed method and band patch are useful for artifact reduction for sparse-view CT.
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