干涉测量
波前
光学
相(物质)
天文干涉仪
光学工程
物理
限制
量子力学
机械工程
工程类
出处
期刊:Optical Engineering
[SPIE - International Society for Optical Engineering]
日期:1984-08-01
卷期号:23 (4)
被引量:196
摘要
Conventional phase measuring interferometry normally requires one-half to sixty seconds acquisition time, limiting measurement to stationary phenomena such as optical element wavefronts. We have developed an instantaneous phase measuring interferometer (PMI) that measures displacements at one point to a resolution of 0.003 um. We describe this instrument and an interferometer measuring phase to X/2000 with a measurement time aperture of less than 1 As. Also described is an attached system for analyzing and displaying wavefronts at up to 10 Hz.
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