悬臂梁
材料科学
偏转(物理)
光学
振动
灵敏度(控制系统)
角位移
声学
物理
电子工程
工程类
复合材料
作者
En‐Te Hwu,Shao-Kang Hung,Chih‐Wen Yang,Kuang-Yuh Huang,Ing‐Shouh Hwang
出处
期刊:Nanotechnology
[IOP Publishing]
日期:2008-02-18
卷期号:19 (11): 115501-115501
被引量:49
标识
DOI:10.1088/0957-4484/19/11/115501
摘要
Here we demonstrate that an astigmatic detection system (ADS), constructed with a modified digital-versatile-disk (DVD) optical head, can achieve real-time measurement of a linear displacement and two-dimensional (2D) tilt angles with a high sensitivity. An atomic force microscope (AFM), using our detection system to sense the deflection of microfabricated cantilevers, can resolve single atomic steps on graphite surfaces with a noise level less than 0.04 nm in topographic images. This astigmatic detection system can even detect mechanical resonances due to thermal vibrations of microfabricated cantilevers. The high sensitivity, small detecting size and high bandwidth of this detection system is suitable for dynamic characterization of elements in micromachined components. Further optimization of the system will promise many other applications in diverse technological fields.
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