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符号
背景(考古学)
计算机科学
算法
静电放电
数学
工程类
电气工程
算术
电压
古生物学
生物
作者
Kuo-Hsuan Meng,E. Rosenbaum
出处
期刊:IEEE Transactions on Device and Materials Reliability
[Institute of Electrical and Electronics Engineers]
日期:2013-06-01
卷期号:13 (2): 371-378
被引量:7
标识
DOI:10.1109/tdmr.2013.2258672
摘要
It is demonstrated that if the compact model of a snapback-type device is calibrated using only pulsed $I$ – $V$ data, it may not correctly reproduce the device response to arbitrary electrostatic discharge (ESD) waveforms. Transient $I$ – $V$ measurements are demonstrated to improve the completeness of the device characterization and model verification. Given an accurately calibrated ESD compact model, circuit simulations may be used to identify device-tester interactions that have been reported to cause unexpected damage during ESD testing. The interaction between a snapback device and an ESD tester can be understood in the context of a relaxation oscillator.
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