发射率
热导率
热传导
材料科学
热力学
热导率测量
反向
电导率
热的
稳态(化学)
热辐射
光学
复合材料
物理
化学
数学
几何学
物理化学
量子力学
作者
Tairan Fu,Peng Tan,Minghao Duan
标识
DOI:10.1088/0957-0233/26/1/015003
摘要
A method was developed to simultaneously measure the total hemispherical emissivity and the thermal conductivity of samples at high temperatures. The inverse problem to determine the emissivity and thermal conductivity from steady-state high-temperature calorimetric experiments was established based on models for these two quantities. The accuracy of the inverse solution was numerically analyzed for various noise levels for samples with various thermophysical properties. The simulation results illustrate that the calculation accuracies for the emissivity and thermal conductivity strongly depend on the proportions of the radiation and conduction heat fluxes in the strip sample arising from the temperature distributions in the sample. Steady-state high-temperature experiments with nickel samples were used to experimentally verify the method. The inverse solution results for the emissivity and thermal conductivity calculated from the measured data agree well with reported data in the literature. This research provides a useful reference for measuring the total hemispherical emissivity and thermal conductivity of conductive samples at high temperatures.
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