蚀刻(微加工)
曲面(拓扑)
各向异性
材料科学
各向同性腐蚀
表面能
腐蚀坑密度
前线(军事)
能量(信号处理)
光电子学
光学
机械工程
纳米技术
复合材料
几何学
工程类
数学
物理
统计
图层(电子)
标识
DOI:10.1088/0960-1317/3/3/005
摘要
A new approach for the simulation of wet anisotropic etching, using a geometric method is described. The influence of the whole exposed surface on the etched shape of the device is taken into account by consideration of the free surface energy at the etch front. This enables the unequivocal simulation of the etch fronts even in sophisticated cases. A criterion for the stability of a given structure exposed to etch solutions can also be derived.
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