佩多:嘘
工作职能
材料科学
X射线光电子能谱
紫外光电子能谱
辐照
光电子学
欧姆接触
紫外线
开尔文探针力显微镜
电导率
光谱学
化学工程
纳米技术
图层(电子)
原子力显微镜
化学
物理化学
工程类
物理
核物理学
量子力学
作者
Abderrafia Moujoud,Sang Hoon Oh,Hyun Soo Shin,Hyun Jae Kim
标识
DOI:10.1002/pssa.200983711
摘要
Abstract In this work, we study the effect of UV light on the work function of PEDOT:PSS films. The authors found that UV irradiation lead to an increase in the work function. Several devices with UV exposed and unexposed PEDOT:PSS were fabricated and measured. The current–voltage characteristics have been obtained for ITO/PEDOT:PSS/InZnO samples. We found that UV irradiated devices show better electrical characteristics and lead to Ohmic contact. The trend in device performance was explained by the observed changes in the work function of the PEDOT:PSS layer. The change in the work function was measured by ultraviolet photoelectron spectroscopy. The structural and morphological properties of PEDOT:PSS films with and without UV treatment were investigated by X‐ray photoelectron spectroscopy and atomic force microscopy techniques. The change in the work function of PEDOT:PSS is mainly due to the surface conformational change. The stability of devices with and without UV treatment has been investigated under normal environmental conditions. Electrical properties of the devices have been studied over a period of 30 and 60 days. The stability tests show that devices with UV treatment are more stable that those without UV treatment.
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