扩展X射线吸收精细结构
振幅
失真(音乐)
吸收(声学)
材料科学
Atom(片上系统)
分析化学(期刊)
表面扩展X射线吸收精细结构
分子物理学
化学
吸收光谱法
光学
物理
色谱法
放大器
光电子学
CMOS芯片
计算机科学
复合材料
嵌入式系统
作者
KUNQUAN LU,Edward A. Stern
出处
期刊:Nuclear instruments and methods in physics research
[Elsevier]
日期:1983-07-01
卷期号:212 (1-3): 475-478
被引量:62
标识
DOI:10.1016/0167-5087(83)90730-5
摘要
Powdered samples samples are commonly used to measure the extended X-ray absorption fine structure (EXAFS) and near-edge structure. It is shown that sizes of particles typically employed produce significant reduction in the EXAFS amplitude for concentrated samples. The distortion is calculated and found to be in good agreement with measurements on FeSi2 samples. To obtain accurate EXAFS amplitudes on powdered samples it is necessary to use particles significantly smaller than 400 mesh when the atom of interest is concentrated.
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