光子集成电路
计算机科学
谐振器
电子工程
解复用器
波分复用
电子线路
时域
光子学
绝缘体上的硅
光学滤波器
滤波器(信号处理)
光学
波长
多路复用
光电子学
材料科学
电信
物理
硅
工程类
计算机视觉
多路复用器
量子力学
出处
期刊:Optics Express
[The Optical Society]
日期:2024-04-29
卷期号:32 (11): 18493-18493
摘要
The performance of silicon photonic integrated circuits (PICs), especially wavelength filters, can be highly sensitive to variations in the fabrication process due to the large refractive index contrast of the silicon on insulator platform. This paper proposes an easy-to-implement and efficient time-domain variability analysis method for passive PICs. The method utilizes the polynomial chaos expansion technique to construct Verilog-A based models for estimating the statistical information of stochastic passive PICs. In comparison to existing methods, this approach is considerably easy to implement, efficient, and exhibits superior scalability, particularly as the numbers of ports and random parameters in the studied PICs increase. The technique is demonstrated via the time-domain variability analysis of a ring-resonator-based wavelength filter and a Mach-Zehnder interferometer-based demultiplexer filter.
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