光电探测器
响应度
材料科学
光电子学
紫外线
平版印刷术
薄膜
探测器
暗电流
光学
纳米技术
物理
作者
Yuchen Du,Shiqi Yin,Ying Li,Jiawang Chen,Dongfeng Shi,Erjuan Guo,Hui Zhang,Zihan Wang,Qinggang Qin,Chongwen Zou,Tianyou Zhai,Liang Li
标识
DOI:10.1002/smtd.202300175
摘要
Abstract GaN's outstanding physical characteristics allow for a wide range of applications in numerous industries. Although individual GaN‐based ultraviolet (UV) photodetectors are the subject of in‐depth research in recent decades, the demand for photodetectors array is rising as a result of advances in optoelectronic integration technology. However, as a prerequisite for constructing GaN‐based photodetectors array, large‐area, patterned synthesis of GaN thin films remains a certain challenge. This work presents a facile technique for pattern growing high‐quality GaN thin films for the assembly of an array of high‐performance UV photodetectors. This technique uses UV lithography, which is not only very compatible with common semiconductor manufacturing techniques, but also enables precise patterning modification. A typical detector has impressive photo‐response performance under 365 nm irradiation, with an extremely low dark current of 40 pA, a high I light / I dark ratio over 10 5 , a high responsivity of 4.23 AW −1 , and a decent specific detectivity of 1.76 × 10 12 Jones. Additional optoelectronic studies demonstrate the strong homogeneity and repeatability of the photodetectors array, enabling it to serve as a reliable UV image sensor with enough spatial resolution. These outcomes highlight the proposed patterning technique's enormous potential.
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