村上
AMOLED公司
亮度
亮度
发光效率
材料科学
计算机科学
光电子学
液晶显示器
计算机视觉
光学
有源矩阵
薄膜晶体管
物理
纳米技术
图层(电子)
作者
Jian Cai,Kun Li,Dedong Han,Lifeng Liu,Yi Wang
摘要
Mura artifacts reduction (De‐Mura) processing, with a high performance for low grayscales, is developed and integrated in display drivers for active‐matrix organic light‐emitting diode (AMOLED) display. The proposed De‐Mura processing, designed to compensate an AMOLED panel's luminance Mura (L‐Mura) and color Mura (C‐Mura), shows excellent display performance, and the major display properties include a diminished luminance non‐uniformity under low grayscales (<= Gray 16) and low luminous brightness (<= 2 cd/m 2 ), and an improved visually imperceptible color non‐uniformity. Our works reveals an effective solution to work around the inevitable difficulties of optical measurement of AMOLED panels under low luminous brightness.
科研通智能强力驱动
Strongly Powered by AbleSci AI