球栅阵列
互连
倒装芯片
有限元法
可靠性(半导体)
虚拟样机
机械工程
电子包装
快速成型
立体光刻
计算机模拟
计算机科学
变形(气象学)
网格
电子工程
焊接
材料科学
工程类
模拟
结构工程
复合材料
功率(物理)
计算机网络
物理
数学
胶粘剂
图层(电子)
量子力学
几何学
作者
R. Döring,R. Dudek,Sven Rzepka,L. Scheiter,E. Noack,B. Seiler
出处
期刊:Journal of Electronic Packaging
[ASME International]
日期:2022-12-13
卷期号:145 (1)
摘要
Abstract A methodology is presented that allows the evaluation of the thermomechanical reliability of electronic packages using “virtual prototyping.” Here, a virtual flip chip ball grid array (FC-BGA) is examined in comparison to a reference chip scale package (CSP). The comparison is performed using finite element simulation. A combined measurement-simulation technique is used to calibrate the finite element simulations on a reference object. The adjustment is based on the in-plane deformation field obtained by both simulation and optical measurement. For the latter, an optical sensor is used for in-plane deformation and strain field analysis based on the gray-scale correlation method. The findings obtained can be extrapolated to alternative package types with different but similar design to evaluate their suitability for the desired application before physical fabrication.
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