拉曼光谱
材料科学
纳米技术
可靠性(半导体)
表面增强拉曼光谱
计算机科学
透视图(图形)
工程物理
系统工程
数据科学
拉曼散射
物理
工程类
人工智能
光学
量子力学
功率(物理)
作者
Hao Ma,Si‐Qi Pan,Weili Wang,Xiaxia Yue,Xiao-Han Xi,Sen Yan,De‐Yin Wu,Xiang Wang,Guokun Liu,Bin Ren
出处
期刊:ACS Nano
[American Chemical Society]
日期:2024-05-20
卷期号:18 (22): 14000-14019
被引量:17
标识
DOI:10.1021/acsnano.4c02670
摘要
While surface-enhanced Raman spectroscopy (SERS) has experienced substantial advancements since its discovery in the 1970s, it is an opportunity to celebrate achievements, consider ongoing endeavors, and anticipate the future trajectory of SERS. In this perspective, we encapsulate the latest breakthroughs in comprehending the electromagnetic enhancement mechanisms of SERS, and revisit CT mechanisms of semiconductors. We then summarize the strategies to improve sensitivity, selectivity, and reliability. After addressing experimental advancements, we comprehensively survey the progress on spectrum-structure correlation of SERS showcasing their important role in promoting SERS development. Finally, we anticipate forthcoming directions and opportunities, especially in deepening our insights into chemical or biological processes and establishing a clear spectrum-structure correlation.
科研通智能强力驱动
Strongly Powered by AbleSci AI