扫描透射电子显微镜
能量过滤透射电子显微镜
电子能量损失谱
低能电子显微镜
透射电子显微镜
光谱学
扫描共焦电子显微镜
电子光谱学
纳米技术
材料科学
电子
显微镜
物理
电子显微镜
光学
量子力学
作者
Hangwen Guo,Mohammad Saghayezhian,Zhen Wang,Yimei Zhu,Jiandi Zhang,Ward Plummer
标识
DOI:10.1007/s11467-019-0942-z
摘要
Complex oxide interfaces have been one of the central focuses in condensed matter physics and material science. Over the past decade, aberration corrected scanning transmission electron microscopy and spectroscopy has proven to be invaluable to visualize and understand the emerging quantum phenomena at an interface. In this paper, we briefly review some recent progress in the utilization of electron microscopy to probe interfaces. Specifically, we discuss several important challenges for electron microscopy to advance our understanding on interface phenomena, from the perspective of variable temperature, magnetism, electron energy loss spectroscopy analysis, electronic symmetry, and defects probing.
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