材料科学
X射线光电子能谱
光电流
异质结
光电子学
光电探测器
半导体
薄膜
带隙
退火(玻璃)
化学工程
纳米技术
复合材料
工程类
作者
Junli Wang,Shaopeng Li,Tingting Wang,Fan Guan,Lijun Zhao,Longhua Li,Junhao Zhang,Guanjun Qiao
标识
DOI:10.1021/acsami.0c09180
摘要
Semiconductor-sensitized TiO2 thin films with long-term air stability are attractive for optoelectronic devices and applications. Herein, we demonstrate the potential of the TiO2 thin film (∼800 nm in thickness) sensitized with a Sb2Se3 layer (∼350 nm) grown from solution spin coating and processed by annealing recrystallization at 300 °C for high-performance optical detection. The type-II band alignment, p-Sb2Se3/n-TiO2 heterojunction, and narrow band gap of Sb2Se3 (∼1.25 eV) endow the film photodetector with a large photocurrent, high switching stability and on/off ratio (>103), and fast response speeds (<20 ms) under the broadband visible–near-infrared irradiation in a zero-bias self-powered photovoltaic mode. In particular, the photodetector shows notable resistance to oxidation and moisture for long-term operation, which is linked to the modest surface oxidation (Sb–O) of Sb2Se3, as verified by X-ray photoelectron spectroscopy. The first-principles calculations show that a low and medium concentration of oxygen substitution for Se (OSe) and oxygen interstitial (Oi) with negative formation energies can lead to such a moderate surface oxidation but do not generate impurity states or just introduce a shallow-level acceptor state in the electronic structures of Sb2Se3 without degrading its optoelectronic performance. Our theoretical results offer a rational explanation for the air-stable and oxidation/moisture-resistant characteristics in moderately oxidized Sb2Se3 and may shed light on the surface oxidation–property relationship studies of other nonoxide semiconductor-sensitized devices.
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