单层
纳米核糖学
化学气相沉积
X射线光电子能谱
拉曼光谱
纳米尺度
材料科学
基质(水族馆)
化学成分
沉积(地质)
光谱学
纳米技术
物理气相沉积
涂层
摩擦学
复合材料
分析化学(期刊)
化学
化学工程
光学
有机化学
物理
地质学
工程类
古生物学
海洋学
生物
量子力学
沉积物
作者
Ales Rapuc,He Wang,Tomáš Polcar
标识
DOI:10.1016/j.apsusc.2021.149762
摘要
We present nanoscale frictional analysis of three commonly used transition metal dichalcogenide (TMD) monolayers, WS2, MoSe2 and WSe2, deposited by chemical vapour deposition (CVD). The monolayers were characterised by Raman spectroscopy, photoluminescence spectroscopy (PL), and X-ray spectroscopy (XPS), to determine the composition of the coating and confirm monolayer structure. Nanoscale frictional analysis was performed by atomic force microscopy (AFM). Load-dependent frictional behaviour was measured at different sliding speeds to quantitatively assess friction on each sample. All samples experienced low nanoscale friction, with the lowest friction observed on WSe2. The friction was independent of sliding speed within the analysed range. Furthermore, monolayer TMDs significantly increase the operational load range by at least one order of magnitude when compared to SiO2 substrate.
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