模数转换器
炸薯条
逐次逼近ADC
抖动
歪斜
比较器
CMOS芯片
计算机科学
电压基准
采样(信号处理)
校准
无杂散动态范围
奈奎斯特频率
线性
电子工程
滤波器(信号处理)
电压
物理
电气工程
工程类
电信
量子力学
作者
Yuan Zhou,Benwei Xu,Yun Chiu
出处
期刊:IEEE Journal of Solid-state Circuits
[Institute of Electrical and Electronics Engineers]
日期:2019-08-01
卷期号:54 (8): 2207-2218
被引量:40
标识
DOI:10.1109/jssc.2019.2915583
摘要
This paper presents a 12-b, 1-GS/s ADC array, realized by time-interleaving four 250-MS/s pipelined SAR ADCs, with integrated on-chip reference voltage buffers. A reference ADC-based calibration algorithm treats static nonlinearity, gain, and offset errors in the array. Timing-skew errors between the sub-ADCs are distinguished from those of the gain mismatches by the assistance of an analog high-pass filter (HPF) for input slope information and subsequently corrected by digitally controlled delay lines (DCDLs). Directly driven off the on-chip 50-Ω termination resistors without any dedicated input buffer, the 65-nm CMOS prototype ADC array also employs a frequency-hopped, randomly-sampling scheme for the ref. ADC, eliminating the spectral effect of its interference to the main array. The core ADC consumes 31.5 mW and occupies an area of 0.27 mm 2 , including nine on-chip reference voltage buffers, the ref. ADC, and the HPF path. The measured peak signal to noise and distortion ratio of the array is 65.3 dB, and the measured spurious-free dynamic range is >70 dB from dc to 500 MHz at 1 GS/s with calibration. The prototype ADC chip achieves an figure of merit of 20.9 and 59.7 fJ/step (the latter is limited by the jitter of an off-chip clock source) for a low-frequency input and a Nyquist input, respectively.
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