Recent Developments in X‐Ray Fluorescence for Characterization of Nano‐Structured Materials

Chapter 14 Recent Developments in X-Ray Fluorescence for Characterization of Nano-Structured Materials M.K. Tiwari, M.K. Tiwari Synchrotrons Utilization Section, Raja Ramanna Centre for Advanced Technology (RRCAT), Indore, 452013 IndiaSearch for more papers by this author M.K. Tiwari, M.K. Tiwari Synchrotrons Utilization Section, Raja Ramanna Centre for Advanced Technology (RRCAT), Indore, 452013 IndiaSearch for more papers by this author Book Editor(s):Vivek Kumar Singh, Vivek Kumar Singh University of Lucknow, Lucknow, IndiaSearch for more papers by this authorJun Kawai, Jun Kawai Kyoto University, Kyoto, JapanSearch for more papers by this authorDurgesh Kumar Tripathi, Durgesh Kumar Tripathi Amity University, Noida, Uttar Pradesh, IndiaSearch for more papers by this author First published: 04 April 2022 https://doi.org/10.1002/9781119645719.ch14 AboutPDF ToolsRequest permissionExport citationAdd to favoritesTrack citation ShareShare Give accessShare full text accessShare full-text accessPlease review our Terms and Conditions of Use and check box below to share full-text version of article.I have read and accept the Wiley Online Library Terms and Conditions of UseShareable LinkUse the link below to share a full-text version of this article with your friends and colleagues. Learn more.Copy URL Share a linkShare onFacebookTwitterLinked InRedditWechat Summary In a general sense, grazing incidence X-ray fluorescence (GIXRF) can be considered another variant of Total reflection XRF. This chapter provides a basic overview of the GIXRF analysis. Using combined XRR and GIXRF investigations it is possible to obtain a precise and consistent set of micro-structural parameters of a thin-layered specimen, deposited on top of a substrate surface. In order to show the potential and merits of the GIXRF technique, angle-dependent X-ray fluorescence measurements have been described for some single and bilayer structures. The chapter describes various examples to demonstrate a variety of salient features and capabilities which are offered by the combined analysis approach. Micro-structural analysis of more complex nano-structured materials has been described using combined XRR and GIXRF analysis. GIXRF measurements also allow depth-resolved characterization of absorbed impurities on various surfaces. The chapter also describes surface characterization of float glass substrate for the diffusion of tin impurities. X‐Ray Fluorescence in Biological Sciences: Principles, Instrumentation, and Applications RelatedInformation