雪崩光电二极管
光电二极管
光学
光电子学
波长
撞击电离
单光子雪崩二极管
材料科学
噪音(视频)
雪崩二极管
暗电流
量子效率
光子计数
物理
光电探测器
电离
光子
探测器
击穿电压
离子
量子力学
电压
人工智能
计算机科学
图像(数学)
作者
Chee Hing Tan,A. V. Velichko,Leh Woon Lim,Jo Shien Ng
出处
期刊:Optics Express
[The Optical Society]
日期:2019-02-15
卷期号:27 (4): 5835-5835
被引量:5
摘要
An avalanche photodiode with a ratio of hole-to-electron ionization coefficients, k = 0, is known to produce negligible excess noise irrespective of the avalanche gain. The low noise amplification process can be utilized to detect very low light levels. In this work, we demonstrated InAs avalanche photodiodes with high external quantum efficiency of 60% (achieved without antireflection coating) at the peak wavelength of 3.48 µm. At 77 K, our InAs avalanche photodiodes show low dark current (limited by 300 K blackbody background radiation), high avalanche gain and negligible excess noise, as InAs exhibits k = 0. They were therefore able to detect very low levels of light, at 15-31 photons per 50 µs laser pulse at 1550 nm wavelength. These correspond to the lowest detected average power by InAs avalanche photodiodes, ranging from 19 to 40 fW. The measurement system's noise floor was dominated by the pre-amplifier. Our results suggest that, with a lower system noise, InAs avalanche photodiodes have high potential for optical detection of single or few-photon signal levels at wavelengths of 1550 nm or longer.
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