压电
材料科学
压电系数
压电响应力显微镜
纳米尺度
复合材料
极限抗拉强度
纳米
拉伤
平面应力
平面(几何)
纳米技术
光电子学
铁电性
电介质
结构工程
医学
几何学
数学
有限元法
内科学
工程类
作者
Corey Carlos,Jun Li,Ziyi Zhang,Kevin Jordan Berg,Yizhan Wang,Xudong Wang
出处
期刊:Nano Letters
[American Chemical Society]
日期:2023-06-29
卷期号:23 (13): 6148-6155
被引量:12
标识
DOI:10.1021/acs.nanolett.3c01728
摘要
Two-dimensional (2D) piezoelectric materials have recently drawn intense interest in studying the nanoscale electromechanical coupling phenomenon and device development. A critical knowledge gap exists to correlate the nanoscale piezoelectric property with the static strains often found in 2D materials. Here, we present a study of the out-of-plane piezoelectric property of nanometer-thick 2D ZnO-nanosheets (NS) in correlation to in-plane strains, using in situ via strain-correlated piezoresponse force microscopy (PFM). We show that the strain configuration (either tensile or compressive) can dramatically influence the measured piezoelectric coefficient (d33) of 2D ZnO-NS. A comparison of the out-of-plane piezoresponse is made for in-plane tensile and compressive strains approaching 0.50%, where the measured d33 varies between 2.1 and 20.3 pm V–1 resulting in an order-of-magnitude change in the piezoelectric property. These results highlight the important role of in-plane strain in the quantification and application of 2D piezoelectric materials.
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