MOSFET
机制(生物学)
电流(流体)
电子工程
材料科学
碳化硅
计算机科学
电气工程
工程类
物理
电压
晶体管
量子力学
冶金
作者
Jianwei Lv,Chao Cai,Baihan Liu,Yiyang Yan,Zhigang Zheng,Yong Kang
出处
期刊:IEEE Transactions on Power Electronics
[Institute of Electrical and Electronics Engineers]
日期:2024-06-01
卷期号:39 (6): 7536-7559
标识
DOI:10.1109/tpel.2024.3368519
摘要
The dynamic current imbalance between paralleled SiC mosfet s can cause unbalanced switching losses and limit the current capacity. It is essential to investigate the influences of the circuit parameters. However, the influences of the unbalanced parasitic mutual inductances and the influences of the common values between the paralleled parameters are unclear. To address these issues, an improved current sharing model is established considering all the parasitic mutual inductances. Based on this model, it is found that the influence degrees of the unbalanced power-drive source mutual inductance (Δ M pk ), the unbalanced drain-source mutual inductance (Δ M ds ) and the unbalanced power-source inductance (Δ L s ), the unbalanced power-gate mutual inductance (Δ M pg ), and the unbalanced threshold voltages (Δ V th ) increase in order. The influence mechanisms of the unbalanced parasitic mutual inductances are also analyzed. Moreover, the effects of the common values between the paralleled parameters ( M gk , R gin , M pg , M pk , M ds , and L s ) are also investigated. Increasing M pg , M ds , and L s or decreasing M pk and M gk can help reduce the current imbalance. Increasing R gin can also decrease the unbalanced currents if Δ V th is small. All conclusions are well verified by experiments, and their contributions to the design of circuit layouts and current sharing methods are discussed.
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