XNOR门
逻辑门
与非门
稳健性(进化)
光子学
光学计算
和大门
光子晶体
通流晶体管逻辑
硅光子学
NOR门
光开关
异或门
计算机科学
电子工程
拓扑(电路)
光电子学
材料科学
电子线路
工程类
电气工程
数字电子学
生物化学
基因
化学
作者
Furong Zhang,Lingjuan He,Huizhen Zhang,Ling‐Jun Kong,Xinhai Xu,Xiangdong Zhang
标识
DOI:10.1002/lpor.202200329
摘要
Abstract As the field of topological photonics has developed over the past 10 years, it has been proven that the combination of topology and photons is very beneficial to the design of robust optical devices against some disturbances. However, most of the work on robust optical logic devices stays at the theoretical level. There are very few topologically‐protected logic devices fabricated in experiments. Here, the experimental fabrication of a series of topologically‐protected all‐optical logic gates is reported. Seven topologically‐protected all‐optical logic gates (OR, XOR, NOT, XNOR, NAND, NOR, and AND) are fabricated on silicon photonic platforms, which show strong robustness even if some disorders exist. These robust logic devices are potentially applicable in future optical signal processing and computing applications.
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