扫描探针显微镜
扫描隧道显微镜
钻石
显微镜
音叉
量子位元
材料科学
导电原子力显微镜
显微镜
量子传感器
光电子学
分辨率(逻辑)
自旋极化扫描隧道显微镜
扫描离子电导显微镜
纳米尺度
纳米技术
扫描隧道光谱
光学
量子
量子技术
原子力显微镜
扫描共焦电子显微镜
物理
振动
量子力学
人工智能
计算机科学
开放量子系统
复合材料
作者
Ke Bian,Wentian Zheng,Xiakun Chen,Shichen Zhang,Rainer Stöhr,Andrej Denisenko,Sen Yang,Jörg Wrachtrup,Ying Jiang
摘要
We designed and built up a new type of ambient scanning probe microscope (SPM), which is fully compatible with state-of-the-art quantum sensing technology based on the nitrogen-vacancy (NV) centers in diamond. We chose a qPlus-type tuning fork (Q up to ∼4400) as the current/force sensor of SPM for its high stiffness and stability under various environments, which yields atomic resolution under scanning tunneling microscopy mode and 1.2-nm resolution under atomic force microscopy mode. The tip of SPM can be used to directly image the topography of nanoscale targets on diamond surfaces for quantum sensing and to manipulate the electrostatic environment of NV centers to enhance their sensitivity up to a single proton spin. In addition, we also demonstrated scanning magnetometry and electrometry with a spatial resolution of ∼20 nm. Our new system not only paves the way for integrating atomic/molecular-scale color-center qubits onto SPM tips to produce quantum tips but also provides the possibility of fabricating color-center qubits with nanoscale or atomic precision.
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