材料科学
硅
纹理(宇宙学)
光电子学
太阳能电池
短路
电流密度
铝
蚀刻(微加工)
各向同性腐蚀
纳米技术
复合材料
电气工程
图层(电子)
电压
物理
量子力学
人工智能
计算机科学
图像(数学)
工程类
作者
Christian Schmiga,Jan Schmidt,A. Metz,A.L. Endrös,Rudolf Hezel
摘要
Abstract Up to now solar cells fabricated on tricrystalline Czochralski‐grown silicon (tri‐Si) have shown relatively low short‐circuit current densities of about 31–33 mA/cm 2 because the three {110}‐oriented grains cannot effectively be textured by commonly used anisotropic etching solutions. In this work, we have optimised a novel chemical texturing step for tri‐Si and integrated it successfully into our solar cell process. Metal/insulator/semiconductor‐contacted phosphorus‐diffused n + p junction silicon solar cells with a silicon‐dioxide‐passivated rear surface and evaporated aluminium contacts were manufactured, featuring a spatially uniform surface texture over all three grains on both cell sides. Despite the simple processing sequence and cell structure, an independently confirmed record efficiency of 17.6% has been achieved. This excellent efficiency is mainly due to an increased short‐circuit current density of 37 mA/cm 2 obtained by substantially reduced reflection and enhanced light trapping. Copyright © 2003 John Wiley & Sons, Ltd.
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