High-κ SrTiO3 thin film as gate dielectric of a solution processed SnO2 thin film transistor

材料科学 薄膜晶体管 电介质 薄膜 光电子学 钛酸锶 高-κ电介质 磁滞 钙钛矿(结构) 纳米技术 图层(电子) 凝聚态物理 化学工程 物理 工程类
作者
Vishwas Acharya,Nila Pal,Utkarsh Pandey,Akhilesh Kumar Yadav,Mukesh Suthar,P.K. Roy,Sajal Biring,Bhola Nath Pal
出处
期刊:Materials Science in Semiconductor Processing [Elsevier BV]
卷期号:155: 107228-107228 被引量:12
标识
DOI:10.1016/j.mssp.2022.107228
摘要

High dielectric constant (high-κ) gate insulating material is an essential component for low operating voltage thin film transistor (TFT) fabrication. Among different high-κ materials, a number of perovskite oxides are widely studied due to their unusually high dielectric constant. Out of them, strontium titanate (SrTiO3) is a well-known perovskite oxide material that has both good insulating behaviors with a very high-κ value. This work demonstrated the SrTiO3 thin film deposition by simple solution processed technique and its application for sol-gel derived SnO2 TFT fabrication. Although this SnO2 TFT can be operated within a low voltage range (<2 V) due to the high-κ value of SrTiO3 thin film, the device can be operating in the high voltage range (>15 V) as well because of its high breakdown voltage. Experimental data of this study indicates, in the low voltage range (<2 V), both output and transfer characteristics of the devices are hysteresis free. However, in the higher voltage range (>5 V), TFT characteristics show some hysteresis. An optimized TFT has carrier mobility ∼0.20 cm2/V.s. with an On/Off ratio of 2.3 × 104 in the low operating voltage range (<2 V) range. Whereas, carrier mobility is reduced a bit in the higher voltage range with a lower On/Off ratio due to the interface charge trapping.
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