材料科学
光电探测器
响应度
光电子学
锡
光探测
等离子体子
紫外线
锗
纳米技术
硅
冶金
作者
Vaishnavi Krishnamurthi,Hareem Khan,Taimur Ahmed,Ali Zavabeti,Sherif Abdulkader Tawfik,Shubhendra Kumar Jain,Michelle J. S. Spencer,Sivacarendran Balendhran,Kenneth B. Crozier,Ziyuan Li,Lan Fu,Md Mohiuddin,Mei Xian Low,Babar Shabbir,Andreas Boes,Arnan Mitchell,C. F. McConville,Yongxiang Li,Kourosh Kalantar‐zadeh,Nasir Mahmood,Sumeet Walia
标识
DOI:10.1002/adma.202004247
摘要
Atomically thin materials face an ongoing challenge of scalability, hampering practical deployment despite their fascinating properties. Tin monosulfide (SnS), a low-cost, naturally abundant layered material with a tunable bandgap, displays properties of superior carrier mobility and large absorption coefficient at atomic thicknesses, making it attractive for electronics and optoelectronics. However, the lack of successful synthesis techniques to prepare large-area and stoichiometric atomically thin SnS layers (mainly due to the strong interlayer interactions) has prevented exploration of these properties for versatile applications. Here, SnS layers are printed with thicknesses varying from a single unit cell (0.8 nm) to multiple stacked unit cells (≈1.8 nm) synthesized from metallic liquid tin, with lateral dimensions on the millimeter scale. It is reveal that these large-area SnS layers exhibit a broadband spectral response ranging from deep-ultraviolet (UV) to near-infrared (NIR) wavelengths (i.e., 280-850 nm) with fast photodetection capabilities. For single-unit-cell-thick layered SnS, the photodetectors show upto three orders of magnitude higher responsivity (927 A W-1 ) than commercial photodetectors at a room-temperature operating wavelength of 660 nm. This study opens a new pathway to synthesize reproduceable nanosheets of large lateral sizes for broadband, high-performance photodetectors. It also provides important technological implications for scalable applications in integrated optoelectronic circuits, sensing, and biomedical imaging.
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