肖特基势垒
凝聚态物理
材料科学
费米能级
半导体
肖特基二极管
化学键
金属
工作(物理)
光电子学
物理
冶金
量子力学
二极管
热力学
电子
标识
DOI:10.1103/physrevlett.84.6078
摘要
Since the time of Bardeen, Fermi level pinning at metal-semiconductor interfaces has traditionally been attributed to interface gap states. The present work shows that polarized chemical bonds at metal-semiconductor interfaces can lead to the apparent Fermi level pinning effect. Good agreement with various systematics of polycrystalline Schottky barrier height experiments has been found. These findings suggest that chemical bonding is a primary mechanism of the Schottky barrier height.
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