无损检测
太赫兹辐射
计算机科学
灵敏度(控制系统)
电介质
可靠性工程
电子工程
工程类
材料科学
电气工程
光电子学
物理
量子力学
作者
Jörg Beckmann,Holger Spranger,Uwe Ewert
标识
DOI:10.1109/fendt.2017.8584511
摘要
Up to now THz-TDS-systems aren't considered to be nondestructive testing facilities for large scale industrial applications, despite it was proven that they provide a comprehensive set of quality parameters. A practical approach to bring THz-TDS in addition to already existing testing systems into the industrial mainstream is systematic development of future test procedures and test facilities for dielectrics. For this purpose polyethylene test specimen with introduced artefacts were designed, to evaluate the detection sensitivity of Time of Flight measurements based on dielectrics. SAFT reconstructed tomograms are presented which visualize the sizes and location of artificially introduced flaws.
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